産総研エネルギー・環境領域
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産総研：ゼロエミッション国際共同研究センター論文Yoshioka, H.; Honda, T., Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network, AIP Adv. 2021, 11, 015101, 10.1063/5.0036982

Yoshioka, H.; Honda, T., Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network, AIP Adv. 2021, 11, 015101, 10.1063/5.0036982

Published JAN 06 2021

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産総研：ゼロエミッション国際共同研究センター論文Yoshioka, H.; Honda, T., Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network, AIP Adv. 2021, 11, 015101, 10.1063/5.0036982